Locally switched and limited source-body bias and other leakage reduction techniques for a low-power embedded SRAM

A low-power embedded SRAM for a large range of applications has been implemented in a standard digital 0.18-μm process. The leakage current in the cells is reduced by using a source-body bias not exceeding the value that guaranties safe data retention, and less leaking nonminimum length transistors. Locally short-circuiting this bias, speed and noise margin loss in active mode is avoided, especially for low supply voltages. The bias is generated internally at the carefully designed equilibrium between cell, switch, and diode limiter leakages averaged over the array. The leakage of the full SRAM, including an optimized periphery, is reduced more than 20 times. Used in an industrial RF transceiver, the measurements confirm its performances.