DocumentCode
1195800
Title
Concurrent-error detection in high-speed carry-free dividers
Author
Wey, C.-L. ; Berthelot, N. ; Veltkamp, B.
Author_Institution
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Volume
141
Issue
6
fYear
1994
fDate
11/1/1994 12:00:00 AM
Firstpage
356
Lastpage
360
Abstract
Rapid advancements in technology demand innovative computation algorithms and hardware structures to achieve high performance. High-speed dividers are commonly designed using SRT division methods. Recently, a high-speed carry-free divider design using redundant binary representation has been presented. Based on the carry-free division algorithm and a more general cell-fault model instead of stuck-at fault model, the paper presents a concurrent error detection scheme using alternating input data. The key to the detection of faults is determining that at least one input combination exists for which the error does not result in alternating outputs. Results show that, with a low hardware overhead, the divider circuit is capable of detecting single/multiple transient faults in one cell during the real-time operation and enhancing its reliability significantly
Keywords
dividing circuits; error detection; fault tolerant computing; logic design; SRT division methods; alternating input data; cell-fault model; concurrent-error detection; divider circuit; high-speed carry-free dividers; high-speed dividers; redundant binary representation; single/multiple transient faults;
fLanguage
English
Journal_Title
Computers and Digital Techniques, IEE Proceedings -
Publisher
iet
ISSN
1350-2387
Type
jour
DOI
10.1049/ip-cdt:19941377
Filename
331620
Link To Document