• DocumentCode
    1195800
  • Title

    Concurrent-error detection in high-speed carry-free dividers

  • Author

    Wey, C.-L. ; Berthelot, N. ; Veltkamp, B.

  • Author_Institution
    Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    141
  • Issue
    6
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    356
  • Lastpage
    360
  • Abstract
    Rapid advancements in technology demand innovative computation algorithms and hardware structures to achieve high performance. High-speed dividers are commonly designed using SRT division methods. Recently, a high-speed carry-free divider design using redundant binary representation has been presented. Based on the carry-free division algorithm and a more general cell-fault model instead of stuck-at fault model, the paper presents a concurrent error detection scheme using alternating input data. The key to the detection of faults is determining that at least one input combination exists for which the error does not result in alternating outputs. Results show that, with a low hardware overhead, the divider circuit is capable of detecting single/multiple transient faults in one cell during the real-time operation and enhancing its reliability significantly
  • Keywords
    dividing circuits; error detection; fault tolerant computing; logic design; SRT division methods; alternating input data; cell-fault model; concurrent-error detection; divider circuit; high-speed carry-free dividers; high-speed dividers; redundant binary representation; single/multiple transient faults;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2387
  • Type

    jour

  • DOI
    10.1049/ip-cdt:19941377
  • Filename
    331620