DocumentCode
1196239
Title
Ensemble Monte Carlo simulation of an AlGaAs/GaAs heterostructure MIS-like FET
Author
Tomizawa, Kazutaka ; Hashizume, Nobuo
Author_Institution
Sch. of Eng., Meiji Univ., Kawasaki, Japan
Volume
35
Issue
7
fYear
1988
fDate
7/1/1988 12:00:00 AM
Firstpage
849
Lastpage
856
Abstract
An ensemble Monte Carlo simulation of a heterostructure MIS-like FET is presented in which the quasi-two-dimensionality of electron gas in the heterostructure is taken into account by the lowest three subbands. An AlGaAs/GaAs heterostructure MIS-like FET with a 1-μm-long gate has been investigated. The electron transport is discussed, as well as the dependence of device performance on the gate length and on the thickness of the AlGaAs semi-insulating layers. The electronic potential in the channel of the FET is substantially affected by the equipotential of the gate metal, showing a nonuniform high electric field present in the submicrometer channel. The electronic transport in the FET reflects this nonuniform high electric field, resulting in nonstationary and hot-electron transport in the submicrometer channel
Keywords
III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium arsenide; high electron mobility transistors; semiconductor device models; solid-state microwave devices; 1 micron; 2D electron gas; AlGaAs-GaAs; HFETs; device performance; electron transport; electronic transport; ensemble Monte Carlo simulation; gate length; heterostructure MIS-like FET; hot-electron transport; lowest three subbands; model; nonuniform high electric field; semiconductors; semiinsulating layer thickness; submicrometer channel; submicron channel; Current-voltage characteristics; Electron mobility; Energy states; Epitaxial layers; Equations; FETs; Gallium arsenide; HEMTs; MODFETs; Wave functions;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.3335
Filename
3335
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