• DocumentCode
    1196239
  • Title

    Ensemble Monte Carlo simulation of an AlGaAs/GaAs heterostructure MIS-like FET

  • Author

    Tomizawa, Kazutaka ; Hashizume, Nobuo

  • Author_Institution
    Sch. of Eng., Meiji Univ., Kawasaki, Japan
  • Volume
    35
  • Issue
    7
  • fYear
    1988
  • fDate
    7/1/1988 12:00:00 AM
  • Firstpage
    849
  • Lastpage
    856
  • Abstract
    An ensemble Monte Carlo simulation of a heterostructure MIS-like FET is presented in which the quasi-two-dimensionality of electron gas in the heterostructure is taken into account by the lowest three subbands. An AlGaAs/GaAs heterostructure MIS-like FET with a 1-μm-long gate has been investigated. The electron transport is discussed, as well as the dependence of device performance on the gate length and on the thickness of the AlGaAs semi-insulating layers. The electronic potential in the channel of the FET is substantially affected by the equipotential of the gate metal, showing a nonuniform high electric field present in the submicrometer channel. The electronic transport in the FET reflects this nonuniform high electric field, resulting in nonstationary and hot-electron transport in the submicrometer channel
  • Keywords
    III-V semiconductors; Monte Carlo methods; aluminium compounds; gallium arsenide; high electron mobility transistors; semiconductor device models; solid-state microwave devices; 1 micron; 2D electron gas; AlGaAs-GaAs; HFETs; device performance; electron transport; electronic transport; ensemble Monte Carlo simulation; gate length; heterostructure MIS-like FET; hot-electron transport; lowest three subbands; model; nonuniform high electric field; semiconductors; semiinsulating layer thickness; submicrometer channel; submicron channel; Current-voltage characteristics; Electron mobility; Energy states; Epitaxial layers; Equations; FETs; Gallium arsenide; HEMTs; MODFETs; Wave functions;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.3335
  • Filename
    3335