DocumentCode :
1196305
Title :
The benefits of bonding: silicon on insulator for bipolar ICs
Author :
Saul, Peter
Author_Institution :
Elettronica (UK) Ltd., UK
Volume :
40
Issue :
6
fYear :
1994
fDate :
11/17/1994 12:00:00 AM
Firstpage :
263
Lastpage :
266
Abstract :
The use of silicon on insulator (SOI) is currently restricted to MOS integrated circuits. The author describes a research programme aimed at extending the benefits of SOI to bipolar devices. The process uses twin wafers, electrochemically bonded to produce oxide-isolated active regions of high purity and very low defect density
Keywords :
bipolar integrated circuits; integrated circuit manufacture; silicon-on-insulator; wafer bonding; bipolar IC; electrochemically bonded wafers; high purity; oxide-isolated active regions; silicon on insulator; very low defect density;
fLanguage :
English
Journal_Title :
IEE Review
Publisher :
iet
ISSN :
0953-5683
Type :
jour
DOI :
10.1049/ir:19940611
Filename :
333657
Link To Document :
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