• DocumentCode
    1196320
  • Title

    Composite reliability evaluation model for different types of distribution systems

  • Author

    Tsao, Teng-Fa ; Chang, Hong-Chan

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
  • Volume
    18
  • Issue
    2
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    924
  • Lastpage
    930
  • Abstract
    The paper develops a set of composite distribution system reliability evaluation models that can be applied to a nonradial type system. The developed models reflect the effect of distribution substations, primary distribution systems, and the interaction between them. First, reliability assessments for five configurations of distribution substation are performed using minimal cut-set technique. Next, the interaction between distribution substation and primary distribution system is modeled according to the tripping behavior of feeder circuit breakers. Last, the contribution of reliability indices evaluated from the primary distribution system is added to the previous two effects, and then the composite load point reliability evaluation models are developed. The developed models are demonstrated on five types of distribution system modified from a reliability test system. Comparisons of reliability indices are made and discussed.
  • Keywords
    circuit breakers; power distribution reliability; substations; composite distribution system reliability model; composite load point reliability evaluation models; composite reliability evaluation model; distribution substations; distribution systems; feeder circuit breakers; minimal cut-set technique; nonradial type system; primary distribution systems; reliability assessments; reliability indices; reliability test system; substation reliability; tripping behavior; Circuit breakers; Circuit testing; Councils; Low voltage; Maintenance; Reliability; Substations; System testing; Terrorism; Topology;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/TPWRS.2003.811174
  • Filename
    1198333