Digital calibration incorporating redundancy of flash ADCs

As feature size and supply voltage shrink, digital calibration incorporating redundancy of flash analog-to-digital converters is becoming attractive. This new scheme allows accuracy to be achieved through the use of redundancy and reassignment, effectively decoupling analog performance from component matching. Very large comparator offsets (several LSBs) are tolerated, allowing the comparators to be small, fast and power efficient. In this paper, we analyze this scheme and compare with it with more traditional approaches.