DocumentCode
1196721
Title
Optoelectronic integrated systems based on free-space interconnects with an arbitrary degree of space variance
Author
Drabik, Timothy J.
Author_Institution
Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
Volume
82
Issue
11
fYear
1994
fDate
11/1/1994 12:00:00 AM
Firstpage
1595
Lastpage
1622
Abstract
It is appealing to contemplate how VLSI or wafer-scale integrated systems incorporating free-space optical interconnection might outperform purely electrically interconnected systems. This paper first provides a uniform treatment of a general class of optical interconnects based on a Fourier-plane imaging system with an array of sources in the object plane and an array of receptors in the image plane. Sources correspond to data outputs of processing “cells,” and receptors to their data inputs. A general abstract optical imaging model, capable of representing a large class of real systems, is analyzed to yield constructive upper bounds on system volume that are comparable to those arising from “3-D VLSI” computational models. These bounds, coupled with technologically derived constraints, form the heart of a design methodology for optoelectronic systems that uses electronic and optical elements each to their greatest advantage, and exploits the available spatial volume and power in the most efficient way. Many of these concepts are embodied in a demonstration project that seeks to implement a bit-serial, multiprocessing system with a radix-2 butterfly topology, and incorporates various new technology developments
Keywords
VLSI; hypercube networks; integrated circuit packaging; integrated optoelectronics; interconnected systems; optical computing; optical interconnections; Fourier-plane imaging system; VLSI; abstract optical imaging model; bit-serial multiprocessing system; butterfly topology; constructive upper bounds; data inputs; data outputs; design methodology; free-space interconnects; free-space optical interconnection; image plane; object plane; optical elements; optoelectronic integrated systems; optoelectronic systems; radix-2; real systems; space variance; spatial volume; wafer-scale integrated systems; Computational modeling; Image analysis; Interconnected systems; Optical arrays; Optical computing; Optical imaging; Optical interconnections; Power system modeling; Upper bound; Very large scale integration;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/5.333741
Filename
333741
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