• DocumentCode
    1196721
  • Title

    Optoelectronic integrated systems based on free-space interconnects with an arbitrary degree of space variance

  • Author

    Drabik, Timothy J.

  • Author_Institution
    Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    82
  • Issue
    11
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    1595
  • Lastpage
    1622
  • Abstract
    It is appealing to contemplate how VLSI or wafer-scale integrated systems incorporating free-space optical interconnection might outperform purely electrically interconnected systems. This paper first provides a uniform treatment of a general class of optical interconnects based on a Fourier-plane imaging system with an array of sources in the object plane and an array of receptors in the image plane. Sources correspond to data outputs of processing “cells,” and receptors to their data inputs. A general abstract optical imaging model, capable of representing a large class of real systems, is analyzed to yield constructive upper bounds on system volume that are comparable to those arising from “3-D VLSI” computational models. These bounds, coupled with technologically derived constraints, form the heart of a design methodology for optoelectronic systems that uses electronic and optical elements each to their greatest advantage, and exploits the available spatial volume and power in the most efficient way. Many of these concepts are embodied in a demonstration project that seeks to implement a bit-serial, multiprocessing system with a radix-2 butterfly topology, and incorporates various new technology developments
  • Keywords
    VLSI; hypercube networks; integrated circuit packaging; integrated optoelectronics; interconnected systems; optical computing; optical interconnections; Fourier-plane imaging system; VLSI; abstract optical imaging model; bit-serial multiprocessing system; butterfly topology; constructive upper bounds; data inputs; data outputs; design methodology; free-space interconnects; free-space optical interconnection; image plane; object plane; optical elements; optoelectronic integrated systems; optoelectronic systems; radix-2; real systems; space variance; spatial volume; wafer-scale integrated systems; Computational modeling; Image analysis; Interconnected systems; Optical arrays; Optical computing; Optical imaging; Optical interconnections; Power system modeling; Upper bound; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.333741
  • Filename
    333741