A framework and method for hierarchical test generation

The authors present an algorithm for hierarchical test generation based on module-oriented decision making (MODEM). The algorithm deals with combinational logic modules and the traditional single-stuck-at model. Modules and faults are captured at the function as well as the gate level. The benefits of hierarchy are realized by introducing a generic module representation and the concepts of a dynamic netlist and a dynamic calculus. The authors present the key elements of MODEM: the framework and fault targeting strategy, the module characterization, and a notation and calculus for module-oriented decision making. They conclude with a high-level view of MODEM implementation and experimental results on a variety of hierarchical benchmarks