DocumentCode :
1197138
Title :
The role of inefficient charge modulations in limiting the current-gain cutoff frequency of the MODFET
Author :
Foisy, Mark C. ; Tasker, Paul J. ; Hughes, Brain ; Eastman, Lester F.
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Volume :
35
Issue :
7
fYear :
1988
fDate :
7/1/1988 12:00:00 AM
Firstpage :
871
Lastpage :
878
Abstract :
A model is presented that clarifies the role of inefficient charge modulation in limiting the current-gain cutoff frequency (fT) of conventional GaAs/AlGaAs and pseudomorphic InGaAs/AlGaAs MODFETs. Both modulation of parasitic charge in the electron-supplying layer and departure from the saturated velocity mode of operation are seen to reduce the efficiency with which the gate controls the drain current. Consequently, fT and the apparent electron velocity are reduced by a factor called the modulating efficiency. Using this model, the superior performance of the pseudomorphic MODFET is explained by its ability to achieve higher sheet densities before modulating parasitic charge in the AlGaAs layer. These results indicate that efficient modulation of the current-producing charge is as important as a high electron velocity
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor device models; solid-state microwave devices; GaAs-AlGaAs; HEMT; InGaAs-AlGaAs; MODFET; apparent electron velocity; current-gain cutoff frequency; electron-supplying layer; higher sheet densities; model; modulating efficiency; modulation of parasitic charge; pseudomorphic MODFET; role of inefficient charge modulations; semiconductors; Cutoff frequency; Density measurement; Electrons; FETs; Gallium arsenide; HEMTs; Indium gallium arsenide; MODFETs; Nanofabrication; Velocity control;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.3338
Filename :
3338
Link To Document :
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