• DocumentCode
    1197145
  • Title

    Macroscopic and microscopic methods for noise in devices

  • Author

    Van Vliet, Carolyne M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Florida Int. Univ., Miami, FL, USA
  • Volume
    41
  • Issue
    11
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    1902
  • Lastpage
    1915
  • Abstract
    After an introduction and preamble concerning the motivation and nature of this article, we proceed to the two main divisions, Part I containing a compendium of macroscopic methods used for noise computation, and Part II comprising the underlying microscopic description. In each part there are subdivisions, dealing with particular methods like the Master-Equation approach, the Langevin approach, the impedance field and transfer impedance approach, etc. Then there are sub-sub divisions dealing with particular noise manifestations, like g-r noise, velocity-fluctuation and Brownian motion noise, transport noise, etc. Illustrative examples are included, but in-depth specific device noise computations are outside the scope of this review
  • Keywords
    Brownian motion; random noise; semiconductor device models; semiconductor device noise; Brownian motion noise; Langevin approach; g-r noise; impedance field approach; macroscopic methods; master-equation approach; microscopic methods; noise computation; semiconductor device noise; transfer impedance approach; transport noise; velocity-fluctuation noise; Acoustic noise; Equations; Impedance; Microscopy; Monte Carlo methods; Noise generators; Quantum mechanics; Radiative recombination; Semiconductor device noise; Statistics;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.333806
  • Filename
    333806