DocumentCode :
1197145
Title :
Macroscopic and microscopic methods for noise in devices
Author :
Van Vliet, Carolyne M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Florida Int. Univ., Miami, FL, USA
Volume :
41
Issue :
11
fYear :
1994
fDate :
11/1/1994 12:00:00 AM
Firstpage :
1902
Lastpage :
1915
Abstract :
After an introduction and preamble concerning the motivation and nature of this article, we proceed to the two main divisions, Part I containing a compendium of macroscopic methods used for noise computation, and Part II comprising the underlying microscopic description. In each part there are subdivisions, dealing with particular methods like the Master-Equation approach, the Langevin approach, the impedance field and transfer impedance approach, etc. Then there are sub-sub divisions dealing with particular noise manifestations, like g-r noise, velocity-fluctuation and Brownian motion noise, transport noise, etc. Illustrative examples are included, but in-depth specific device noise computations are outside the scope of this review
Keywords :
Brownian motion; random noise; semiconductor device models; semiconductor device noise; Brownian motion noise; Langevin approach; g-r noise; impedance field approach; macroscopic methods; master-equation approach; microscopic methods; noise computation; semiconductor device noise; transfer impedance approach; transport noise; velocity-fluctuation noise; Acoustic noise; Equations; Impedance; Microscopy; Monte Carlo methods; Noise generators; Quantum mechanics; Radiative recombination; Semiconductor device noise; Statistics;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.333806
Filename :
333806
Link To Document :
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