• DocumentCode
    1197165
  • Title

    Optimized Gate Drivers for Internally Commutated Thyristors (ICTs)

  • Author

    Köllensperger, Peter ; De Doncker, Rik W.

  • Author_Institution
    Inst. for Power Electron. & Electr. Drives, RWTH Aachen Univ., Aachen
  • Volume
    45
  • Issue
    2
  • fYear
    2009
  • Firstpage
    836
  • Lastpage
    842
  • Abstract
    Currently, gate commutated thyristors (GCTs) are commonly used for high-power voltage-source inverters due to their superior electrical performance as compared to gate-turn-off (GTO) thyristors and high-voltage insulated-gate bipolar transistors (HV-IGBTs). However, the gate driver of GCTs is more complex than an IGBT driver and has to be attached closely to the GCT, which implies several constructional disadvantages. The internally commutated thyristor (ICT), a GCT with integrated turn-off unit, enables the use of a simplified and more reliable gate driver, maintaining the electrical advantages of the GCT. In this paper, the ICT concept is discussed in relation to standard GCTs. Additionally, an optimized gate driver for the ICT is presented. Close attention is paid to improve reliability and easy adaption to different ICT current ratings.
  • Keywords
    insulated gate bipolar transistors; invertors; thyristors; gate commutated thyristors; gate-turn-off thyristors; high-power voltage-source inverters; high-voltage insulated-gate bipolar transistors; internally commutated thyristors; optimized gate drivers; Capacitors; Driver circuits; Impedance; Industry Applications Society; Insulated gate bipolar transistors; Inverters; Power electronics; Temperature; Thyristors; Voltage; Gate drive unit; ICT; IGCT; power semiconductor device; reliabilty; short-circuit detection;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2009.2013574
  • Filename
    4802274