DocumentCode :
1197165
Title :
Optimized Gate Drivers for Internally Commutated Thyristors (ICTs)
Author :
Köllensperger, Peter ; De Doncker, Rik W.
Author_Institution :
Inst. for Power Electron. & Electr. Drives, RWTH Aachen Univ., Aachen
Volume :
45
Issue :
2
fYear :
2009
Firstpage :
836
Lastpage :
842
Abstract :
Currently, gate commutated thyristors (GCTs) are commonly used for high-power voltage-source inverters due to their superior electrical performance as compared to gate-turn-off (GTO) thyristors and high-voltage insulated-gate bipolar transistors (HV-IGBTs). However, the gate driver of GCTs is more complex than an IGBT driver and has to be attached closely to the GCT, which implies several constructional disadvantages. The internally commutated thyristor (ICT), a GCT with integrated turn-off unit, enables the use of a simplified and more reliable gate driver, maintaining the electrical advantages of the GCT. In this paper, the ICT concept is discussed in relation to standard GCTs. Additionally, an optimized gate driver for the ICT is presented. Close attention is paid to improve reliability and easy adaption to different ICT current ratings.
Keywords :
insulated gate bipolar transistors; invertors; thyristors; gate commutated thyristors; gate-turn-off thyristors; high-power voltage-source inverters; high-voltage insulated-gate bipolar transistors; internally commutated thyristors; optimized gate drivers; Capacitors; Driver circuits; Impedance; Industry Applications Society; Insulated gate bipolar transistors; Inverters; Power electronics; Temperature; Thyristors; Voltage; Gate drive unit; ICT; IGCT; power semiconductor device; reliabilty; short-circuit detection;
fLanguage :
English
Journal_Title :
Industry Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-9994
Type :
jour
DOI :
10.1109/TIA.2009.2013574
Filename :
4802274
Link To Document :
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