DocumentCode
1197165
Title
Optimized Gate Drivers for Internally Commutated Thyristors (ICTs)
Author
Köllensperger, Peter ; De Doncker, Rik W.
Author_Institution
Inst. for Power Electron. & Electr. Drives, RWTH Aachen Univ., Aachen
Volume
45
Issue
2
fYear
2009
Firstpage
836
Lastpage
842
Abstract
Currently, gate commutated thyristors (GCTs) are commonly used for high-power voltage-source inverters due to their superior electrical performance as compared to gate-turn-off (GTO) thyristors and high-voltage insulated-gate bipolar transistors (HV-IGBTs). However, the gate driver of GCTs is more complex than an IGBT driver and has to be attached closely to the GCT, which implies several constructional disadvantages. The internally commutated thyristor (ICT), a GCT with integrated turn-off unit, enables the use of a simplified and more reliable gate driver, maintaining the electrical advantages of the GCT. In this paper, the ICT concept is discussed in relation to standard GCTs. Additionally, an optimized gate driver for the ICT is presented. Close attention is paid to improve reliability and easy adaption to different ICT current ratings.
Keywords
insulated gate bipolar transistors; invertors; thyristors; gate commutated thyristors; gate-turn-off thyristors; high-power voltage-source inverters; high-voltage insulated-gate bipolar transistors; internally commutated thyristors; optimized gate drivers; Capacitors; Driver circuits; Impedance; Industry Applications Society; Insulated gate bipolar transistors; Inverters; Power electronics; Temperature; Thyristors; Voltage; Gate drive unit; ICT; IGCT; power semiconductor device; reliabilty; short-circuit detection;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/TIA.2009.2013574
Filename
4802274
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