DocumentCode :
1197644
Title :
High Temperature Embedded SiC Chip Module (ECM) for Power Electronics Applications
Author :
Yin, Jian ; Liang, Zhenxian ; Van Wyk, Jacobus Daniel
Author_Institution :
Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ.
Volume :
22
Issue :
2
fYear :
2007
fDate :
3/1/2007 12:00:00 AM
Firstpage :
392
Lastpage :
398
Abstract :
Technology for a 3-D high temperature integrated power electronics module for applications involving high density, and high temperature (e.g., those over 200degC) is described. The high temperature embedded chip module (ECM) technology is proposed to realize a lower stress distribution in a mechanically balanced structure with double-sided metallization layers and material coefficient of thermal expansion match in the structure. This technology for packaging the active component is also proposed for universal use with a flip-over structure and pressure connections. The fabrication process of this high temperature ECM is presented. The forward and reverse characteristics of the high temperature ECM have been measured up to 279degC. Thermally induced mechanical stress is reduced to an acceptable level by applying a symmetrical structure with buffering layers
Keywords :
buffer layers; high-temperature electronics; integrated circuit metallisation; modules; monolithic integrated circuits; power electronics; thermal expansion; wide band gap semiconductors; buffering layers; coefficient of thermal expansion; double-sided metallization layers; flip-over structure; high temperature embedded silicon carbide chip module; integrated power electronics module; power electronics; thermally induced mechanical stress; Electrochemical machining; Electronic packaging thermal management; Fabrication; Inorganic materials; Metallization; Power electronics; Silicon carbide; Temperature distribution; Thermal expansion; Thermal stresses; Coefficient of thermal expansion (CTE); embedded chip module (ECM);
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2006.889901
Filename :
4118339
Link To Document :
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