DocumentCode :
1197652
Title :
Dual-Ramp A/D Converter Error Due to Nonideal Integrator Capacitor
Author :
Buchanan, James E.
Volume :
24
Issue :
1
fYear :
1975
fDate :
3/1/1975 12:00:00 AM
Firstpage :
33
Lastpage :
39
Abstract :
It is shown that very high accuracy hybrid packaged dual-ramp analog-to-digital converters can be built using ceramic NPO-type chip capacitors that exhibit a dielectric absorption specification of 0.75 percent. Capacitor recovery voltage is shown versus time for several 0.01-/g-m/F NPO-type ceramic capacitors. An absorptive capacitor model for the NPO capacitor is shown. Typical component values for an absorptive model of an 0.01-/g=m/F NPO capacitor are determined. The worst case integrator error due to dielectric absorption in a particular synchro-to-digital converter utilizing two dual-ramp converters with 0.01-/g=m/F integrator capacitors is shown to be in the order of microvolts.
Keywords :
Absorption; Analog-digital conversion; Capacitance; Capacitors; Ceramics; Dielectric constant; Dielectric materials; High-K gate dielectrics; Packaging; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1975.4314365
Filename :
4314365
Link To Document :
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