• DocumentCode
    1197793
  • Title

    Losses of aluminium-stabilized superconducting conductors for Large Helical Device

  • Author

    Sumiyoshi, F. ; Kanai, Y. ; Kawashima, T. ; Iwakuma, M. ; Mito, T. ; Takahata, K. ; Yanagi, N. ; Yanagi, N. ; Yamamoto, J.

  • Author_Institution
    Fac. of Eng., Kagoshima Univ., Japan
  • Volume
    28
  • Issue
    1
  • fYear
    1992
  • fDate
    1/1/1992 12:00:00 AM
  • Firstpage
    210
  • Lastpage
    213
  • Abstract
    The optimum design of aluminium-stabilized superconducting conductors used for the helical coil system of the Large Helical Device (LHD) project was investigated from the low loss point of view. A short sample conductor of about 50 cm long was used in the experiment. The loss measuring system originally fabricated is mainly composed of a superconducting split magnet of a race-track type and a superconducting transformer. The data of the AC loss observed in the frequency range from 0.1 Hz to 120 Hz show the existence of two peaks just as the analysis predicted. The peak at the lower frequency is the critical frequency of the inter-strand coupling time constant τc. The other peak at the higher frequency is the skin frequency of the normal metal around the strand bundle in the conductor. For the practical condition of the LHD corresponding to 0.1 Hz, the loss can be decreased by an increase in τc
  • Keywords
    composite superconductors; fusion reactor materials; fusion reactor theory and design; magnetic leakage; stellarators; superconducting cables; superconducting magnets; 0.1 to 120 Hz; AC loss; Al; Large Helical Device; NbTi superconductors; NbTi-Al superconductors; critical frequency; helical coil system; inter-strand coupling time constant; loss measuring system; optimum design; skin frequency; Aluminum; Conductors; Frequency; Loss measurement; Magnetic analysis; Magnetic field measurement; Numerical analysis; Skin; Superconducting coils; Superconducting magnets;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.119847
  • Filename
    119847