DocumentCode
1197960
Title
Frequency dependence of the unilateral gain in bipolar transistors
Author
Tiwari, Sandip
Author_Institution
IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
10
Issue
12
fYear
1989
Firstpage
574
Lastpage
576
Abstract
The frequency dependence of the current gain and the unilateral gain in advanced bipolar transistors is analyzed. A GaAlAs/GaAs heterostructure bipolar transistor (HBT) is used as an example to show that the extrinsic parasitics still dominate the gain rolloff. Transit-time effects, even though they are a significant component of the time constants that determine the f/sub T/ and f/sub max/ of transistors, do not cause a change in the rolloff of unilateral gain with a frequency from 6 to 12 dB/octave in these advanced devices. Devices with very large transit times, and hence low f/sub T/ and f/sub max/ may, however, exhibit the rolloff change if designed to have a very low fringing capacitance and other parasitics.<>
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; solid-state microwave devices; GaAlAs-GaAs; HBT; current gain; device parasitics; extrinsic parasitics; f/sub T/; f/sub max/; frequency dependence; gain rolloff; heterostructure bipolar transistors; maximum frequency of oscillation; microwave transistors; models; semiconductors; transit time effects; unilateral gain; unity current gain frequency; Bipolar transistors; Delay; Electron emission; Extrapolation; Frequency dependence; Frequency estimation; Frequency measurement; Heterojunction bipolar transistors; Parasitic capacitance; Resonance;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.43144
Filename
43144
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