• DocumentCode
    1198010
  • Title

    Design, fabrication and testing of spin-valve read heads for high density recording

  • Author

    Tsang, Ching ; Fontana, Robert E. ; Lin, Tsann ; Heim, D.E. ; Speriosu, Virgil S. ; Gurney, Bruce A. ; Williams, Mason L.

  • Author_Institution
    Adv. Magnetic Recording Lab., IBM Corp., San Jose, CA, USA
  • Volume
    30
  • Issue
    6
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    3801
  • Lastpage
    3806
  • Abstract
    Spin-valve sensors of the type NiFe/Cu/Co have been designed for optimal biasing behavior and successfully incorporated into a gigabit-type shielded read head configuration with a read trackwidth of 2 μm, a read gap of 0.25 μm, and a MR sensor height of 1 μm. The spin-valve sensor had a structure of 100 Å NiFe/25 Å Cu/22 Å Co/110 Å FeMn, and yielded a net spin-valve coefficient of ~3.5% at the completion of head processing. Uniform field testing of the read heads after wafer fabrication and lapping showed quiet and stable spin-valve response with near optimal bias performance. Recording tests of the read heads at a head-disk clearance of 1.5 μm showed linear, non-saturated signal response on a media with an areal moment as high as 1.25 memu/cm2, yielding reasonably symmetrical signals with peak-to-peak amplitudes ranging from ~750 μV/μm to as high as ~1000 μV/μm of read trackwidth. Linear density rolloffs and microtrack profiles have also been studied, and results showed behaviors closely agreeing with design targets for high density recording operations
  • Keywords
    cobalt; copper; iron alloys; magnetic heads; magnetic recording; magnetic sensors; magnetoresistive devices; nickel alloys; MR sensor; NiFe-Cu-Co-FeMn; areal moment; biasing; density rolloffs; design; gigabit-type shielded read head; high density recording; lapping; linear signal response; microtrack profiles; spin-valve sensors; testing; wafer fabrication; Fabrication; Magnetic anisotropy; Magnetic flux; Magnetic heads; Magnetic moments; Magnetic recording; Magnetic sensors; Magnetic shielding; Perpendicular magnetic anisotropy; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.333909
  • Filename
    333909