Magnetic properties and crystallography of double-layer CoCrTa thin films with various interlayers

Author

Feng, Y.C. ; Laughlin, D.E. ; Lambeth, D.N.

Author_Institution

Dept. of Mater. Sci. & Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

3960

Lastpage

3962

Abstract

In this work, the hysteretic properties and remanence curves of double-layer CoCrTa thin films with various interlayers (Al, Cu, Ag, and Cr) are investigated. It is found that the double-layer CoCrTa films with Cu or Ag interlayers have narrower switching field distributions but similar high coercivities, compared with the films with Cr interlayers. To understand the effects of interlayers on the magnetic properties, the crystallography of these multilayer thin films are studied. The results from this work show that Ag and Cu are strong candidates as interlayer materials in multilayer magnetic-recording media

Keywords

X-ray diffraction; chromium; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; magnetic hysteresis; magnetic multilayers; magnetic recording; remanence; tantalum alloys; X-ray crystallography; double-layer CoCrTa thin films; high coercivities; hysteretic properties; interlayers; magnetic properties; multilayer magnetic-recording media; remanence curves; switching field distributions; Chromium; Coercive force; Crystallography; Magnetic films; Magnetic hysteresis; Magnetic materials; Magnetic multilayers; Magnetic properties; Remanence; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.333957

Filename

333957