Title :
Microstructure and recording properties of bicrystal disks with GaAs substrates
Author :
Ding, Juren ; Zhu, Jim-Gang
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
Bicrystal disks with CoCrTa magnetic layer and Cr underlayer were fabricated on {001} GaAs single crystalline wafers. It is found that the epitaxial orientation relationship of Cr onto GaAs is {001}⟨110⟩ Cr||{001}⟨110⟩ GaAs. Disks with coercivity up to 2600 Oe, accompanied by near unity coercive and remanent squarenesses, were obtained. Measured medium noise power is extremely low and remains unchanged as recording density increases up to 4000 fr/mm. The recording properties of the bicrystal media are compared with those of conventional longitudinal thin film media which have similar coercivities
Keywords :
bicrystals; chromium; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; gallium arsenide; magnetic disc storage; magnetic recording noise; magnetic thin film devices; magnetic thin films; remanence; tantalum alloys; CoCrTa-Cr-GaAs; GaAs; bicrystal disks; coercivity; epitaxial orientation relationship; medium noise power; recording density; recording properties; remanent squarenesses; Chromium; Coercive force; Crystal microstructure; Crystallization; Density measurement; Disk recording; Gallium arsenide; Magnetic recording; Noise measurement; Power measurement;
Journal_Title :
Magnetics, IEEE Transactions on
