The relationship of medium noise to system error rate in a PRML channel

Author

Fitzpatrick, James ; Bertram, H. Neal ; Che, Xiaodong ; Barbosa, Lineu C. ; Lin, Gang Herbert

Author_Institution

Quantum Corp., Milpitas, CA, USA

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

3990

Lastpage

3995

Abstract

High density disk drive systems utilize fine grain polycrystalline thin films as storage medium. These films exhibit noise that is pattern dependent and has appreciable magnitude near the center of each recorded transition. A model for error rates in a PRML channel is presented to explore how variations in medium noise parameters effect system performance. The channel is assumed to be characterized by both pattern dependent nonstationary medium noise and white Gaussian electronic and/or head noise. Results are presented in terms of both error rate and sensitivity of error rate to changes in medium parameters

Keywords

Gaussian noise; error statistics; magnetic disc storage; magnetic recording noise; magnetic thin films; white noise; PRML channel; fine grain polycrystalline thin films; head noise; high density disk drive systems; pattern dependent nonstationary medium noise; recorded transition; storage medium; system error rate; white Gaussian electronic noise; Detectors; Error analysis; Gaussian noise; Magnetic films; Magnetic heads; Magnetic noise; Magnetic recording; Signal to noise ratio; System performance; White noise;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.333967

Filename

333967