Experimental and micromagnetic study of track edge noise reduction effect in multilayer thin film media

Author

Ye, Xiao-Guang ; Lam, Terence T. ; Zhu, Jian-Gang

Author_Institution

Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

3999

Lastpage

4001

Abstract

A time domain spin-stand tester noise measurement and a micromagnetic modeling study are conducted to investigate the track edge noise reduction effect in multilayer thin film media. Both experimental and modeling studies show that track edge noise is concentrated in the side written band of a reversed bit-cell, in which the magnetization is opposite to the previous dc erased state. The track edge noise level is substantially suppressed for films laminated with a very thin non-magnetic interlayer. Thus the multilayer thin film media is more suitable for future narrow track recording

Keywords

magnetic multilayers; magnetic recording noise; DC erased state; laminated films; magnetization; micromagnetic model; multilayer thin film media; narrow track recording; nonmagnetic interlayer; reversed bit-cell; side written band; time domain spin-stand tester noise measurement; track edge noise; Magnetic flux; Magnetic multilayers; Magnetic noise; Magnetic separation; Magnetostatic waves; Micromagnetics; Noise reduction; Nonhomogeneous media; Saturation magnetization; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.333969

Filename

333969