Title :
Small Moisture Content Measurements for Nylon Chip and Granulated Sugar by Dielectric Loss Method
Author :
Arai, Tomokazu ; Ichijo, Bunjiro
fDate :
6/1/1977 12:00:00 AM
Abstract :
A moisture-content measuring device operating on the dielectric loss measurement principle has been developed. The device can measure the moisture content in the range of 0.1-1.5 percent consistently for the nylon chip and the granulated sugar.
Keywords :
Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrical resistance measurement; Electrodes; Frequency measurement; Loss measurement; Moisture measurement; Powders; Semiconductor device measurement;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.1977.4314515
