Title :
A dual-core 64-bit ultraSPARC microprocessor for dense server applications
Author :
Takayanagi, Toshinari ; Shin, Jinuk Luke ; Petrick, Bruce ; Su, Jeffrey Y. ; Levy, Howard ; Pham, Ha ; Son, Jinseung ; Moon, Nathan ; Bistry, Dina ; Nair, Umesh ; Singh, Mandeep ; Mathur, Vikas ; Leon, Ana Sonia
Author_Institution :
Sun Microsystems Inc., Sunnyvale, CA, USA
Abstract :
A dual-core 64-bit microprocessor optimized for compute-dense systems such as rack-mount and blade servers for network computing was developed. The chip consists of two UltraSPARC II cores, each with its own 512 kB L2 cache, a DDR-1 memory controller, and symmetric multiprocessor bus (JBus) controllers. The 206-mm2 die is fabricated in 0.13-μm CMOS technology with seven layers of Cu and a low-k dielectric. The chip offers a highly efficient performance-per-watt ratio with a typical power dissipation of 23 W at 1.3 V and 1.2 GHz. A short design cycle was achieved by leveraging existing designs wherever possible and developing effective design methodologies and flows. Significant design challenges faced by this project are described. These include deep-submicron design issues, such as negative bias temperature instability (NBTI), leakage, coupling noise, intra-die process variation, and electromigration (EM). A second important design challenge was implementing a high-performance L2 cache subsystem with a short four-cycle core-to-L2 latency including ECC.
Keywords :
CMOS integrated circuits; cache storage; integrated circuit design; microprocessor chips; multi-threading; network servers; 0.13 micron; 1.2 GHz; 1.3 V; 30 W; 512 kbit; 64 bits; CMOS technology; DDR-1 memory controller; L2 cache; UltraSPARC II cores; blade servers; chip multithreading; compute-dense systems; coupling noise; current-mode sense amplifier; deep-submicron technology; dual-core 64-bit ultraSPARC microprocessor; electromigration; hold time; intra-die process variation; negative bias temperature instability; network computing; rack-mount; symmetric multiprocessor bus controllers; thread-level parallelism; translation look aside buffer; Blades; CMOS technology; Computer networks; Design methodology; Dielectrics; Microprocessors; Negative bias temperature instability; Network servers; Niobium compounds; Power dissipation; Chip Multithreading (CMT); ECC; L2 Cache; UltraSPARC; coupling noise; current-mode sense amplifier; deep-submicron technology; dense server; dual-core; electromigration; hold time; leakage; microprocessor; multicore; multiprocessor; multithread; negative bias temperature instability (NBTI); process variation; thread-level parallelism (TLP); translation look aside buffer (TLB);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.838023