Title :
Friction and wear of particulate and ME magnetic tapes sliding against a Mn-Zn ferrite head in a linear mode
Author :
Bhushan, Bharat ; Lowry, John A.
Author_Institution :
Dept. of Mech. Eng., Ohio State Univ., Columbus, OH, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
The objective of this study is to identify differences in the friction and wear characteristics of various particulate and metal evaporated (ME) magnetic tapes. Co-γFe2O3, CrO2, metal particle (MP), barium ferrite (BaFe) and ME tapes were run against Mn-Zn ferrite head samples in a linear mode under accelerated conditions. Coefficient of friction was recorded and depth of wear on the contact surface of the ferrite samples was measured by an atomic force microscope using a newly developed “nano-scratch” technique. The Co-γFe2O3, MP and BaFe tapes resulted in a much lower wear rate of the mating ferrite sample than the CrO2 tape. MP and BaFe tapes resulted in a finely polished ferrite surface with original roughness eventually worn smooth. Some scratches were produced with all particulate tapes with heavier scratches in contact with CoγFe2O3 and CrO2 tapes. ME tape caused very little wear on ferrite with some mild abrasive action due to wear debris. Transfer of topical lubricant caused some agglomeration of this debris. ME tape showed a lower coefficient of friction against ferrite than the particulate tapes
Keywords :
abrasion; atomic force microscopy; life testing; lubrication; magnetic heads; magnetic particles; magnetic tapes; sliding friction; surface topography; wear; BaFe12O19; BaFe12O19 tapes; Co-γFe2O3 tapes; Co-Fe2O3; CrO2; CrO2 tapes; MnZn ferrite head; abrasive action; accelerated conditions; agglomeration; atomic force microscope; friction; linear mode; lubricant; metal evaporated magnetic tapes; metal particle tapes; nanoscratch technique; particulate magnetic tapes; roughness; wear; wear debris; Acceleration; Atomic force microscopy; Atomic measurements; Barium; Ferrites; Force measurement; Friction; Magnetic heads; Rough surfaces; Surface roughness;
Journal_Title :
Magnetics, IEEE Transactions on