DocumentCode
1199218
Title
Local Memory for a High-Speed Digital Test System
Author
Bush, Thomas S.
Volume
26
Issue
3
fYear
1977
Firstpage
217
Lastpage
220
Abstract
The choice of RAM or SR memory as local memory dictates many of the characteristics of a high-speed digital test system. This paper examines the impact of the choice on test program efficiency, test speed, and system cost. Understanding this impact is important to anyone testing PC boards containing dynamic LSI devices, such as microprocessors.
Keywords
Costs; Electronic equipment testing; Hardware; Image storage; Large scale integration; Random access memory; Read-write memory; Software testing; Strontium; System testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1977.4314539
Filename
4314539
Link To Document