Title :
A 4-Gb/s/pin low-power memory I/O interface using 4-level simultaneous bi-directional signaling
Author :
Kim, Jin-Hyun ; Kim, Sua ; Kim, Woo-Seop ; Choi, Jung-Hwan ; Hwang, Hong-Sun ; Kim, Changhyun ; Kim, Suki
Author_Institution :
DRAM Design Team, Samsung Electron. Co., Gyeonggi-Do, South Korea
Abstract :
This paper presents a simultaneous bi-directional (SBD) 4-level I/O interface for high-speed DRAMs. The data rate of 4 Gb/s/pin was demonstrated using a 500-MHz clock generator and a full CMOS rail-to-rail power swing. The power consumed by the I/O circuit was measured to be 28 mW/pin, when connected to a 10-pF load, at a 1.8-V supply voltage. The transmitter uses a 4-level push-pull linear output driver and a 4-level automatic impedance controller, achieving the reduction of driver currents and the voltage margin as large as 200 mV. The receiver employs a hierarchical sampling scheme, wherein a differential amplifier selects three out of six reference voltage levels. This scheme ensures minimized sampling power and a wide common-mode sampling range. The 6-level reference voltage for sampling is generated by the combination of the transmitter replica. The proposed I/O interface circuits are fabricated using a 0.10-μm, 2-metal layers DRAM process, and the active area is 330 × 66 μm2. It exhibits 200 mV × 690 ps eye windows on the given channel with a 1.8-V supply voltage.
Keywords :
DRAM chips; differential amplifiers; high-speed integrated circuits; low-power electronics; receivers; 1.8 V; 10 pF; 2-metal layers DRAM process; 4 Gbits/s; 4-level automatic impedance controller; 4-level push-pull linear output driver; 4-level simultaneous bi-directional signaling; 500 MHz; 6-level reference voltage; CMOS rail-to-rail power swing; clock generator; differential amplifier; driver current reduction; hierarchical sampling scheme; high-speed DRAM; impedance control; low-power memory I/O interface; reference voltage levels; Automatic voltage control; Bidirectional control; Clocks; Differential amplifiers; Driver circuits; Impedance; Power generation; Power measurement; Sampling methods; Transmitters; 4-level; DRAM; I/O; impedance control; push-pull; simultaneous bi-direction;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.838007