Title :
A 500-MHz multi-banked compilable DRAM macro with direct write and programmable pipelining
Author :
Barth, John E., Jr. ; Anand, Darren ; Burns, Steve ; Dreibelbis, Jeffrey H. ; Fifield, John A. ; Gorman, Kevin ; Nelms, Michael ; Nelson, Erik ; Paparelli, Adrian ; Pomichter, Gary ; Pontius, Dale E. ; Sliva, Stephen
Author_Institution :
IBM, Essex Junction, VT, USA
Abstract :
This work describes a 500-MHz compiled eDRAM macro offered in a 90-nm logic-based process. The macro architecture is optimized for high bandwidth while enabling compilation in bank and data-word dimensions. A direct write scheme simultaneously improves random bank cycle time and row access time without signal loss. The benefits of ground sensing, reference cells, and bitline twisting was reviewed. A variable stage pipeline extends the macro bandwidth while offering flexibility in clock frequencies. The redundancy system is modified to support direct write and piping. Finally, BIST was enhanced to utilize electrically blown fuses, enabling one-touch test and repair. Hardware results was presented.
Keywords :
DRAM chips; built-in self test; macros; pipeline arithmetic; 500 MHz; 90 nm; BIST; bitline twisting; direct write; ground sensing; macro architecture; multibanked compilable DRAM macro; programmable pipelining; redundancy system; reference cells; Application specific integrated circuits; Availability; Bandwidth; Built-in self-test; Clocks; Decoding; Kernel; Logic arrays; Pipeline processing; Random access memory; DRAM macro;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2004.838001