DocumentCode :
1199382
Title :
Reduced order distributed boundary control of thermal transients in microsystems
Author :
Bleris, L.G. ; Kothare, M.V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Lehigh Univ., Bethlehem, PA, USA
Volume :
13
Issue :
6
fYear :
2005
Firstpage :
853
Lastpage :
867
Abstract :
We study the problem of regulation of thermal transients in a microsystem using empirical eigenfunctions. Proper orthogonal decomposition (POD) is applied to an ensemble of data to obtain the dominant structures, called empirical eigenfunctions, that characterize the dynamics of the process. These eigenfunctions are the most efficient basis for capturing the dynamics of an infinite dimensional process with a finite number of modes. In contrast to published approaches, we propose a new receding horizon boundary control scheme using the empirical eigenfunctions in a constrained optimization procedure to track a desired spatiotemporal profile. Finite element method (FEM) simulations of heat transfer are provided and used in order to implement and test the performance of the controller.
Keywords :
eigenvalues and eigenfunctions; finite element analysis; heat transfer; microfluidics; optimisation; reduced order systems; system-on-chip; thermal variables control; FEM; POD; RHC; boundary reduced order control; constrained optimization; empirical eigenfunctions; finite element method; heat transfer; horizon boundary control; microsystem; proper orthogonal decomposition; receding horizon control; reduced order distributed boundary control; spatiotemporal profile; thermal transients; Aerospace electronics; Cost function; Distributed control; Eigenvalues and eigenfunctions; Finite element methods; Heat transfer; Spatiotemporal phenomena; Temperature control; Temperature sensors; Thermal conductivity; Boundary reduced order control; empirical eigenfunctions; microsystems; receding horizon control (RHC);
fLanguage :
English
Journal_Title :
Control Systems Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-6536
Type :
jour
DOI :
10.1109/TCST.2005.854332
Filename :
1522226
Link To Document :
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