Determination of the narrow read width of thin film magnetic recording heads using an error rate model

Author

Huang, M. ; Chu, R. ; Hsia, Y.-T. ; Tran, T.

Author_Institution

Dept. of Applic. Eng., Read-Rite Corp., Milpitas, CA, USA

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

4251

Lastpage

4253

Abstract

A method to determine the magnetic-recording characteristics of a thin film head has been developed using error rate sampling. By combining results from a typical `747´ curve and a modified `747´ curve, called adjacent data curve, parameters such as the write width, the read width, and the side fringing erased band of a thin film head can be directly measured. In addition, the signal to noise ratio and the noise intensity level in the side fringing erased bands, normalized to signal strength, can also be determined, These measured parameters can be used to calculate the track profile width. When comparing the calculated profile widths with those obtained from the directly measured track profile curve, excellent agreement has been found, thus validating the proposed method

Keywords

error analysis; magnetic heads; magnetic recording noise; magnetic thin film devices; 747 curve; adjacent data curve; error rate model; error rate sampling; narrow read width; noise intensity level; read width; side fringing erased band; signal to noise ratio; thin film magnetic recording heads; track profile width; write width; Equations; Error analysis; Magnetic films; Magnetic heads; Magnetic noise; Magnetic recording; Noise level; Position measurement; Q measurement; Signal to noise ratio;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.334051

Filename

334051