A model for Lorentz microscopy and magnetic behaviour of longitudinal thin film with an irregular lattice

Author

Walmsley, N.S. ; Dean, C. ; Hart, A. ; Parker, D.A. ; Chantrell, R.W.

Author_Institution

Dept. of Math. & Stat., Univ. of Central Lancashire, Preston, UK

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

4362

Lastpage

4364

Abstract

Lorentz microscopy is an important experimental technique currently being used to investigate magnetic microstructures found in longitudinal thin films. Micromagnetic models of thin films have previously been based on regular hexagonal lattices; a Monte-Carlo algorithm has been developed which produces an irregular structure with a grain size distribution. We model Lorentz microscopy by integrating the in-plane components of the stray field along a straight line trajectory. The effects of packing fraction and structure regularity on the remanence and coercivity values are discussed; we show that regularity has a qualitative effect on the simulated Lorentz images of coercive states

Keywords

Monte Carlo methods; coercive force; electron microscopy; magnetic thin films; remanence; Lorentz microscopy; Monte-Carlo algorithm; coercivity; irregular lattice; longitudinal thin film; magnetic microstructures; packing fraction; remanence; structure regularity; Electron beams; Grain size; Lattices; Lorentz covariance; Magnetic films; Magnetic force microscopy; Mathematical model; Micromagnetics; Physics; Transistors;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.334088

Filename

334088