Title :
Online self-repair of FIR filters
Author :
Benso, Alfredo ; Di Carlo, Stefano ; Di Natale, Giorgio ; Prinetto, Paolo
Abstract :
Chip-level failure detection has been a target of research for some time, but today´s very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today´s chips. This article introduces a self-repair-solution for the digital FIR filter, one of the key blocks used in DSPs.
Keywords :
FIR filters; digital filters; digital signal processing chips; DSPs; chip-level failure detection; deep-submicron technology; digital FIR filter; online self-repair; Algebra; Circuits; Delay lines; Digital filters; Digital signal processing chips; Equations; Finite impulse response filter; Logic; Pipelines; Transfer functions;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1198686
