DocumentCode
1200162
Title
Infrastructure IP for configuration and test of boards and systems
Author
Clark, C.J. ; Ricchetti, Mike
Volume
20
Issue
3
fYear
2003
Firstpage
78
Lastpage
87
Abstract
Embedding infrastructure IP to optimize chip-level manufacturing test and debugging has recently become common practice. However, adopting the same approach for boards and systems requires a different family of infrastructure IP. This article introduces such a family and discusses how it can optimize manufacturing test and debugging, as well as support configurability, especially in today´s reconfigurable products.
Keywords
field programmable gate arrays; integrated circuit testing; logic testing; printed circuits; chip-level manufacturing test; configurability; debugging; infrastructure IP; Automatic testing; Circuit testing; Costs; Debugging; Design engineering; Integrated circuit testing; Logic testing; Manufacturing; Semiconductor device testing; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2003.1198689
Filename
1198689
Link To Document