The Third Generation of ATE

This paper discusses the objectives that motivate continued development of integrated automatic test systems. It identifies three key elements commonly associated with so-called third-generation systems: computer involvement in stimulus generation and resolution of measurement characteristics; programmable interface units; and on-line software systems. This paper delineates how and why these features are regarded as advancements in test equipment. It examines the "third-generation" idea from three perspectives: strengths, weaknesses, and potential.