• DocumentCode
    1200368
  • Title

    Numerical modeling of two-dimensional device structures using Brandt´s multilevel acceleration scheme: application to Poisson´s equation

  • Author

    Smith, James H. ; Steer, Kenneth M. ; Miller, Timothy F. ; Fonash, Stephen J.

  • Author_Institution
    Pennsylvania State Univ., University Park, PA, USA
  • Volume
    10
  • Issue
    6
  • fYear
    1991
  • fDate
    6/1/1991 12:00:00 AM
  • Firstpage
    822
  • Lastpage
    824
  • Abstract
    In expanding numerical modeling for electronic and optoelectronic devices from a single dimension to multiple dimensions, a large increase in machine storage space is required. Solution approaches based on relaxation techniques are typically used to minimize this increase, but they can be slow to converge. Presented is an adaption of Brandt´s multilevel acceleration scheme for control volume discretizations coupled with solvers based on either Stone´s strongly implicit method or the Gauss-Siedel (G-S) method to overcome this speed and storage space problem. This approach is demonstrated by solving Poisson´s equation in a two-dimensional amorphous silicon thin-film transistor structure. The structure has a generalized density of states function whose occupancy is computed using nonzero degree Kelvin Fermi-Dirac statistics. It is shown that the use of the multilevel acceleration algorithm gives more than an order of magnitude increase in the asymptotic rate of convergence for the potential distribution in this thin-film transistor. Numerical results of the analysis are presented
  • Keywords
    convergence of numerical methods; optoelectronic devices; semiconductor device models; 2D TFT structure; Gauss-Siedel method; Poisson´s equation; amorphous Si; convergence; generalized density of states function; multilevel acceleration scheme; nonzero degree Kelvin Fermi-Dirac statistics; numerical modeling; strongly implicit method; thin-film transistor structure; two-dimensional device structures; Acceleration; Amorphous silicon; Convergence; Gaussian processes; Kelvin; Numerical models; Optoelectronic devices; Poisson equations; Statistical distributions; Thin film transistors;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.137510
  • Filename
    137510