DocumentCode :
1200423
Title :
Influence of DC bias field, excitation and detection frequencies on magnetic Barkhausen noise analysis
Author :
Sipahi, Levent B.
Author_Institution :
Dept. of Electr. Eng. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume :
30
Issue :
6
fYear :
1994
fDate :
11/1/1994 12:00:00 AM
Firstpage :
4590
Lastpage :
4592
Abstract :
The micromagnetic Barkhausen emissions, widely known as Barkhausen noise, are quite dependent on excitation and detection frequencies. The input variables to generate these emissions are amplitude, wave form and frequency of magnetic excitation field. When DC bias field is coupled with an AC magnetic field, this complex excitation give rises to distortion of the magnetic hysteresis loop. Recent work showed the frequency dependence of hysteresis curves in ferromagnetic materials. Since there is strong correlation between the location on the BΠ loop and Barkhausen noise, comprehending the magnetization mechanisms at each location is essential. The current investigation indicated significant changes in voltage waveforms, pulse height spectra, frequency spectra and RMS voltages of magnetic Barkhausen noise in magnetic materials with different DC bias fields, detection and excitation frequencies
Keywords :
Barkhausen effect; ferromagnetic materials; magnetic hysteresis; magnetic noise; magnetic variables measurement; AC magnetic field; Barkhausen noise; DC bias field; RMS voltages; complex excitation; detection frequencies; distortion; excitation; ferromagnetic materials; frequency dependence; frequency spectra; hysteresis curves; magnetic Barkhausen noise analysis; magnetic excitation field; magnetic hysteresis loop; magnetization mechanisms; micromagnetic Barkhausen emissions; pulse height spectra; voltage waveforms; Couplings; Frequency dependence; Input variables; Magnetic fields; Magnetic hysteresis; Magnetic materials; Magnetic noise; Magnetization; Micromagnetics; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.334158
Filename :
334158
Link To Document :
بازگشت