Title :
Direct imaging of transient interference in a single-mode waveguide using near-field scanning optical microscopy
Author :
Yuan, Guang Wei ; Stephens, Matthew D. ; Dandy, David S. ; Lear, Kevin L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
Near-field scanning optical microscopy was used to image transient interference between the guided mode and a leaky mode induced in a single-mode waveguide due to a localized adlayer. The observed field response in the adlayer region as well as the period and decay length of the subsequent interference are in good agreement with beam propagation calculations. The transient interference impacts the element spacing in local evanescent array coupled sensors.
Keywords :
biological techniques; near-field scanning optical microscopy; optical arrays; optical sensors; optical waveguides; beam propagation calculation; evanescent array coupled sensors; guided mode; leaky mode; near-field scanning optical microscopy; single-mode waveguide; transient interference; Biomedical optical imaging; Interference; Optical imaging; Optical microscopy; Optical propagation; Optical scattering; Optical sensors; Optical surface waves; Optical waveguides; Sensor arrays; Biosensor; evanescent field; leaky mode; near-field scanning optical microscopy (NSOM); optical interference; waveguide;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2005.858151
