DocumentCode
1200458
Title
Wide-band residual phase-noise measurements on 40-GHz monolithic mode-locked lasers
Author
Larsson, David ; Yvind, Kresten ; Hvam, Jorn M.
Author_Institution
Res. Center COM, Tech. Univ. of Denmark, Lyngby, Denmark
Volume
17
Issue
11
fYear
2005
Firstpage
2388
Lastpage
2390
Abstract
We have performed wide-band residual phase-noise measurements on semiconductor 40-GHz mode-locked lasers by employing electrical waveguide components for the radio-frequency circuit. The intrinsic timing jitters of lasers with one, two, and three quantum wells (QW) are compared and our design prediction, concerning noise versus number of QWs, is for the first time corroborated by experiments. A minimum jitter of 44 fs is found, by extrapolating to the Nyquist frequency, for the one-QW device, having nearly transform-limited pulses of 1.2 ps. This jitter is nearly three times lower than for a three-QW laser. There is good agreement between the measured results and existing theory.
Keywords
Nyquist criterion; laser mode locking; laser noise; optical communication equipment; optical pulse generation; phase noise; semiconductor device noise; semiconductor lasers; timing jitter; 1.2 ps; 40 GHz; Nyquist frequency; residua phase-noise measurements; semiconductor monolithic mode-locked lasers; timing jitters; Electric variables measurement; Jitter; Laser mode locking; Laser noise; Performance evaluation; Phase measurement; Quantum well lasers; Semiconductor lasers; Waveguide lasers; Wideband; Jitter; mode-locked laser diode; optical communications;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2005.857983
Filename
1522329
Link To Document