DocumentCode
1200610
Title
Application of the cavity model to lossy power-return plane structures in printed circuit boards
Author
Xu, Minjia ; Wang, Hao ; Hubing, Todd H.
Author_Institution
Hewlett-Packard, San Diego, CA, USA
Volume
26
Issue
1
fYear
2003
Firstpage
73
Lastpage
80
Abstract
Power-return plane pairs in printed circuit boards are often modeled as resonant cavities. Cavity models can be used to calculate transfer impedance parameters used to predict levels of power bus noise. Techniques for applying the cavity model to lossy printed circuit board geometries rely on a low-loss assumption in their derivations. Boards that have been designed to damp power bus resonances (e.g., boards with embedded capacitance) generally violate this low-loss assumption. This paper investigates the validity of the cavity model when applied to printed circuit board structures where the board resonances are significantly damped. Cavity modeling results for sample lossy power-return plane structures are validated using a three-dimensional full wave numerical code. A simple method is also established to check the validity of the cavity model for a power-return plane structure with imperfect conductors and lossy dielectric substrates.
Keywords
capacitance; cavity resonators; dielectric losses; equivalent circuits; modelling; printed circuits; surface impedance; 3D full wave numerical code; cavity model; conductive loss; damped board resonances; dielectric loss; embedded capacitance; imperfect conductors; lossy PCB geometries; lossy dielectric substrates; lossy power-return plane structures; model validation; power bus impedance; power bus modeling; power bus noise; power bus resonances; printed circuit boards; propagation constant; resonant cavities; transfer impedance parameters; Capacitance; Circuit noise; Conductors; Geometry; Impedance; Noise level; Predictive models; Printed circuits; Resonance; Solid modeling;
fLanguage
English
Journal_Title
Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1521-3323
Type
jour
DOI
10.1109/TADVP.2003.811552
Filename
1198945
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