DocumentCode :
1200799
Title :
An Active Frequency Technique for Precise Measurements on Dynamic Microwave Cavity Perturbations
Author :
Akyel, Cevdet ; Bosisio, Renato G. ; April, Georges-Emile
Volume :
27
Issue :
4
fYear :
1978
Firstpage :
364
Lastpage :
368
Abstract :
A new method for the dynamic measurement of the passive parameters of a microwave cavity is described. Both the resonant frequency (f0s) and the loaded Q factor (QLs,) are measured simultaneously from active frequency signals generated by a closedloop circuit containing the test cavity. Resonant frequency deviations of up to 20 MHz are measured with an accuracy of better than ±0.25 percent, and loaded Q-factor variations (from 500 to 7000) are measured with an accuracy of better than ±1.2 percent. The unperturbed cavity resonance was at 2452.0249 MHz, and the time of measurement of each cavity parameter was < 1 s.
Keywords :
Circuit testing; Frequency measurement; Microwave measurements; Microwave theory and techniques; Q factor; Q measurement; RLC circuits; Resonance; Resonant frequency; Signal generators;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1978.4314713
Filename :
4314713
Link To Document :
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