• DocumentCode
    1201200
  • Title

    Electrical and physical characterization of SiFe sheets insulation

  • Author

    Marion-Péra, M.C. ; Waeckerlé, T.

  • Author_Institution
    Lab. d´´Electrotech. de Grenoble, ENSIEG, St. Martin d´´Heres, France
  • Volume
    30
  • Issue
    6
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    4839
  • Lastpage
    4841
  • Abstract
    The study of different kinds of coating of SiFe sheets is reported. Several surface resistance measurements have been carried out with the standard Franklin device. In order to interpret results and to get an accurate characterization of sheet insulation, a physical approach has also been followed using scanning electron microscopy, X-ray analysis, roughness and thickness testers. The correlation between these two ways of investigation has also revealed that the scattering of resistance values reflects the inhomogeneity of the insulating layer caused by the coating itself and by the profile of the iron sheet due to roll prints
  • Keywords
    composite insulating materials; electrical resistivity; insulating coatings; insulation testing; iron alloys; laminations; machine insulation; machine testing; scanning electron microscopy; silicon alloys; surface conductivity; surface topography; SiFe; SiFe sheets insulation; X-ray analysis; coating; electrical characterization; inhomogeneity; physical characterization; roll prints; roughness; scanning electron microscopy; scattering; standard Franklin device; surface resistance; thickness testers; Coatings; Dielectrics and electrical insulation; Electrical resistance measurement; Insulation testing; Measurement standards; Rough surfaces; Scanning electron microscopy; Surface resistance; Surface roughness; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.334239
  • Filename
    334239