DocumentCode
1201377
Title
Testability measures in pseudorandom testing
Author
Ercolani, S. ; Favalli, M. ; Damiani, M. ; Olivo, P. ; Ricco, B.
Author_Institution
DEIS, Bologna Univ., Italy
Volume
11
Issue
6
fYear
1992
fDate
6/1/1992 12:00:00 AM
Firstpage
794
Lastpage
800
Abstract
The authors present two methods for computing the fault detection probabilities in combinational networks. The methods provide a deeper insight into the effects of signal correlations caused by multiple fan-out reconvergencies and can be used in testability analysis to predict the fault coverage of pseudorandom patterns. The performances of these algorithms have been tested on significant benchmarks and compare favorably with those of previous procedures
Keywords
combinatorial circuits; fault location; logic testing; probability; combinational networks; fault coverage; fault detection probabilities; logic circuits; multiple fan-out reconvergencies; pseudorandom patterns; pseudorandom testing; signal correlations; testability analysis; Algorithm design and analysis; Circuit faults; Circuit simulation; Circuit testing; Controllability; Costs; Electrical fault detection; Fault detection; Observability; Probability;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.137524
Filename
137524
Link To Document