Title :
Application-independent testing of FPGA interconnects
Author :
Tahoori, Mehdi Baradaran ; Mitra, Subhasish
Author_Institution :
Center for Reliable Comput., Stanford Univ., CA, USA
Abstract :
We present a new automatic test-configuration-generation technique for application-independent manufacturing testing of the interconnection network of static-random-access-memory-based field programmable gate arrays (FPGAs). This technique targets detection of open and bridging faults in the wiring channels and programmable switches in the interconnects. Experimental results on Xilinx Virtex FPGAs show that very few test configurations are required to cover stuck-open, stuck-closed, open, and bridging faults in the interconnects.
Keywords :
automatic test pattern generation; fault diagnosis; field programmable gate arrays; integrated circuit interconnections; integrated circuit testing; logic testing; FPGA interconnect testing; Xilinx Virtex FPGA; application-independent manufacturing testing; application-independent testing; automatic test-configuration-generation; bridging faults; fault detection; interconnection network testing; open faults; static-random-access-memory-based field programmable gate arrays; stuck-closed faults; stuck-open faults; Automatic testing; Circuit faults; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Manufacturing; Programmable logic arrays; Routing; Switches; Wires; Field programmable gate arrays (FPGAs); interconnections; self-testing; testing;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2005.852452
