• DocumentCode
    1201618
  • Title

    False coupling exploration in timing analysis

  • Author

    Tseng, Ken ; Horowitz, Mark

  • Author_Institution
    Comput. Syst. Lab., Stanford Univ., CA, USA
  • Volume
    24
  • Issue
    11
  • fYear
    2005
  • Firstpage
    1795
  • Lastpage
    1805
  • Abstract
    As integrated circuit technology continues to scale into the nanometer regime, the effect of crosstalk on circuit timing becomes significant. Static timing analysis shows that crosstalk routinely adds 10% to 20% delay to the critical path of a design. However, many aggressor/victim switching combinations are infeasible due to inherent circuit operating constraints, thereby contributing to the mismatch between timing analysis and actual silicon performance. This paper proposes a novel timing analysis technique where circuit functionality, delay, and crosstalk are simultaneously considered using time-sliced Boolean logic. The worst case timing on the critical path end point is calculated to be the minimum and maximum time slices where the timed Boolean logic on its coupled fanin cone is satisfiable. Up to 1-ns reduction in timing pessimism on 0.13-μm industrial designs was observed. Furthermore, results on special circuit topologies such as data busses with coupled interleaved inverters match well with results from exhaustive Spice simulation sweeps with up to 50% reduction in timing pessimism over timing analysis that does not consider false coupling.
  • Keywords
    Boolean functions; circuit CAD; circuit analysis computing; crosstalk; delays; logic CAD; timing; 0.13 micron; 1 ns; circuit analysis computing; circuit crosstalk; circuit delay; circuit functionality; circuit timing; circuit topologies; false coupling; time-sliced Boolean logic; timing analysis; Circuit analysis; Coupling circuits; Crosstalk; Delay; Integrated circuit technology; Logic circuits; Performance analysis; Silicon; Switching circuits; Timing; Crosstalk; false path; interconnect; time sliced Boolean logic; timing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.852435
  • Filename
    1522445