Title :
Epitaxial growth and enhanced saturation magnetization of single crystal Co1-xCrx media suitable for perpendicular magnetic recording
Author :
Krishnan, Kannan M. ; Takeuchi, T. ; Hirayama, Y. ; Futamoto, M.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Kokubunji, Japan
fDate :
11/1/1994 12:00:00 AM
Abstract :
Highly c-axis oriented, single crystal films of Co1-xCr x have been grown epitaxially on mica substrates by e-beam evaporation. The method, using a Ru underlayer, is simple and applicable to similar c-axis oriented, large area growth of the wide range of Co alloys suitable for perpendicular recording. The films show narrow peak widths in X-ray diffraction (ΔΘ00.2~1.0-1.5°) and their magnetic properties are composition dependent. Moreover, for any given Cr concentration, these single crystal films exhibit the largest saturation magnetization when compared with either sputtered/evaporated samples or films grown under identical conditions on glass/silicon substrates. It is shown that this enhanced Ms is directly correlated with the dispersion of the c-axis about the film normal and their narrowest values are observed for these epitaxially grown films. X-ray microanalysis shows some inter/intra-granular variation in Cr content, but systematic segregation trends appropriate for explaining these results have not yet been observed
Keywords :
X-ray diffraction; chromium alloys; cobalt alloys; electron beam deposition; ferromagnetic materials; magnetic epitaxial layers; magnetisation; perpendicular magnetic recording; Co alloys; CoCr; Ru; Ru underlayer; X-ray diffraction; X-ray microanalysis; c-axis oriented films; composition; e-beam evaporation; epitaxial growth; large area growth; magnetic properties; mica substrates; perpendicular magnetic recording; saturation magnetization; segregation; single crystal Co1-xCrx media; Chromium; Cobalt alloys; Epitaxial growth; Magnetic films; Magnetic properties; Perpendicular magnetic recording; Saturation magnetization; Semiconductor films; Substrates; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on