DocumentCode :
1201861
Title :
SLIDE: subspace-based line detection
Author :
Aghajan, Hamid K. ; Kailath, Thomas
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Volume :
16
Issue :
11
fYear :
1994
fDate :
11/1/1994 12:00:00 AM
Firstpage :
1057
Lastpage :
1073
Abstract :
An analogy is made between each straight line in an image and a planar propagating wavefront impinging on an array of sensors so as to obtain a mathematical model exploited in recent high resolution methods for direction-of-arrival estimation in sensor array processing. The new so-called SLIDE (subspace-based line detection) algorithm then exploits the spatial coherence between the contributions of each line in different rows of the image to enhance and distinguish a signal subspace that is defined by the desired line parameters. SLIDE yields closed-form and high resolution estimates for line parameters, and its computational complexity and storage requirements are far less than those of the standard method of the Hough transform. If unknown a priori, the number of lines is also estimated in the proposed technique. The signal representation employed in this formulation is also generalized to handle grey-scale images as well. The technique has also been generalized to fitting planes in 3-D images. Some practical issues of the proposed technique are given
Keywords :
array signal processing; computational complexity; curve fitting; edge detection; object recognition; parameter estimation; 3D images; Hough transform; SLIDE; computational complexity; direction-of-arrival estimation; grey-scale images; line parameter estimation; sensor array processing; signal representation; straight lines; subspace-based line detection; Array signal processing; Direction of arrival estimation; Image resolution; Image sensors; Mathematical model; Parameter estimation; Sensor arrays; Signal resolution; Spatial coherence; Spatial resolution;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/34.334386
Filename :
334386
Link To Document :
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