• DocumentCode
    1201906
  • Title

    A Microprocessor-Based Transformer Test System

  • Author

    Keene, Samuel J., Jr. ; Lohmeier, Wayne L.

  • Volume
    28
  • Issue
    4
  • fYear
    1979
  • Firstpage
    314
  • Lastpage
    316
  • Abstract
    This paper describes a very successful application of a microprocessor to a specific test instrumentation problem: automating the characterization of transformers. Output voltages, ripple, efficiency, and temperature rise are measured automatically over the prescribed range of input variables and conditions. The processor also monitors and stabilizes test conditions. A significant increase in test accuracy has been accomplished. This test system will also test power supply assemblies.
  • Keywords
    Automatic testing; Electrical resistance measurement; Electrical safety; Ferroresonance; Flowcharts; Frequency; Switches; System testing; Temperature measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1979.4314839
  • Filename
    4314839