DocumentCode
1201906
Title
A Microprocessor-Based Transformer Test System
Author
Keene, Samuel J., Jr. ; Lohmeier, Wayne L.
Volume
28
Issue
4
fYear
1979
Firstpage
314
Lastpage
316
Abstract
This paper describes a very successful application of a microprocessor to a specific test instrumentation problem: automating the characterization of transformers. Output voltages, ripple, efficiency, and temperature rise are measured automatically over the prescribed range of input variables and conditions. The processor also monitors and stabilizes test conditions. A significant increase in test accuracy has been accomplished. This test system will also test power supply assemblies.
Keywords
Automatic testing; Electrical resistance measurement; Electrical safety; Ferroresonance; Flowcharts; Frequency; Switches; System testing; Temperature measurement; Voltage;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1979.4314839
Filename
4314839
Link To Document