DocumentCode :
1201906
Title :
A Microprocessor-Based Transformer Test System
Author :
Keene, Samuel J., Jr. ; Lohmeier, Wayne L.
Volume :
28
Issue :
4
fYear :
1979
Firstpage :
314
Lastpage :
316
Abstract :
This paper describes a very successful application of a microprocessor to a specific test instrumentation problem: automating the characterization of transformers. Output voltages, ripple, efficiency, and temperature rise are measured automatically over the prescribed range of input variables and conditions. The processor also monitors and stabilizes test conditions. A significant increase in test accuracy has been accomplished. This test system will also test power supply assemblies.
Keywords :
Automatic testing; Electrical resistance measurement; Electrical safety; Ferroresonance; Flowcharts; Frequency; Switches; System testing; Temperature measurement; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1979.4314839
Filename :
4314839
Link To Document :
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