• DocumentCode
    1202409
  • Title

    In/sub 0.53/Ga/sub 0.47/As junction field-effect transistors as tunable feedback resistors for integrated receiver preamplifiers

  • Author

    Brown, J.J. ; Lo, D.C.W. ; Gardner, J.T. ; Chung, Y.K. ; Lee, C.D. ; Forrest, Stephen R.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
  • Volume
    10
  • Issue
    12
  • fYear
    1989
  • Firstpage
    588
  • Lastpage
    590
  • Abstract
    In/sub 0.53/Ga/sub 0.47/As active feedback junction field-effect transistors (JFETs) for use in integrated transimpedance photoreceivers are discussed. By varying the gate-to-source voltage V/sub GS/, the resistance can be continuously tuned between 3 and 40 k Omega with a drain-to-source capacitance of <10 fF. The temperature coefficient of resistance is between -5 and -20 Omega / degrees C (for V/sub GS/ less than the pinch-off voltage). The combination of large resistance and low capacitance can result in high receiver sensitivity without sacrificing amplifier dynamic range. The feedback FET was fabricated adjacent to 1.8- mu m-gate-length JFETs with transconductances of 110 mS/mm, gate-to-source capacitances of 1.3 pF/mm, and DC amplifier voltage gains of 100. The compatibility of these transistor structures indicates that an integrated preamplifier with dynamically tunable bandwidth can be realized.<>
  • Keywords
    III-V semiconductors; feedback; gallium arsenide; indium compounds; junction gate field effect transistors; optical communication equipment; preamplifiers; receivers; resistors; tuning; 10 fF; 3 to 40 kohm; DC amplifier voltage gains; In/sub 0.53/Ga/sub 0.47/As; TCR; active feedback JFETs; drain-to-source capacitance; dynamically tunable bandwidth; feedback FET; gate-to-source capacitances; integrated receiver preamplifiers; integrated transimpedance photoreceivers; junction field-effect transistors; receiver sensitivity; semiconductors; temperature coefficient of resistance; transconductances; tunable feedback resistors; Bandwidth; FETs; Feedback; Materials science and technology; Optical noise; Optical receivers; Parasitic capacitance; Preamplifiers; Resistors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.43149
  • Filename
    43149