DocumentCode :
1202811
Title :
Wide-band digital tan-δ meter using a phase comparison system
Author :
Saegusa, Takeo ; Hagiwara, Nobumi ; Suzuki, Yoshihisa ; Murase, Hideaki
Volume :
29
Issue :
4
fYear :
1980
Firstpage :
342
Lastpage :
345
Abstract :
The demand for precision in measurement of dielectric loss (tan δ), which is important to clarify the electrical characteristics of dielectrics of capacitors, etc., is increasingly becoming raised in level these days. The authors have published a direct-reading system of tan δ using the phase comparison method and developed a digital tan-δ meter based on the above. The next experiment was construction of a more compact sized all-electronic-type automatic digital tan-δ meter by using a MOSFET as the resistance element for the direct reading of tan δ. As the result of repeated investigations on the main circuits, an automatic digital tan-δ meter was successfully produced having a precision of 10-3- 10-4 at several 10 Hz-several 100 kHz.
Keywords :
Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electric variables measurement; Loss measurement; MOSFET circuits; Measurement standards; Phase measurement; Voltage; Wideband;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1980.4314949
Filename :
4314949
Link To Document :
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