DocumentCode :
1202826
Title :
A High Accuracy Automated Measuring System for Standard-Cell Comparison
Author :
Harmans, Kees J. ; Melsert, Willem ; Koijmans, Chris V. ; Kaarls, Robert
Volume :
29
Issue :
4
fYear :
1980
Firstpage :
346
Lastpage :
348
Abstract :
Described is an automated standard-cell measurement system capable of reaching a 10-nV resolution. A commercial low-cost Basic programmable microcomputer as a controller, two dc motor-driven low-thermal-electromotive force (EMF) multipole switches for standard-cell selection, and a high sensitivity digital nanovoltmeter as the voltage difference measuring device, together with some dedicated and special interface circuitry, provides the basis for the system. Great care has been taken of appropriate screening and guarding to prevent unwanted interference between the digital and analog sections of the system. Great care has been taken of appropriate screening and guarding to prevent unwanted interference between the digital and analog sections of the system. One year´s experience has indicated that in comparing good standard cells a repeatability of 2·10-8 is normal on a day-to-day basis.
Keywords :
Control systems; Force control; Force measurement; Interference; Microcomputers; Nanoscale devices; Switches; Switching circuits; Voltage control; Voltage measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1980.4314950
Filename :
4314950
Link To Document :
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