DocumentCode
1202828
Title
High-speed CMOS wavefront sensor with resistive-ring networks of winner-take-all circuits
Author
Nirmaier, Thomas ; Diez, Cristina Alvarez ; Bille, Josef F.
Author_Institution
Heidelberg Univ., Germany
Volume
40
Issue
11
fYear
2005
Firstpage
2315
Lastpage
2322
Abstract
We present a high-bandwidth Hartmann-Shack sensor for adaptive optics implemented in a standard 0.35 μm CMOS process technology. Hartmann-Shack sensors reconstruct an optical wavefront from the displacement of focal points as imaged by a microlens array. This image is usually captured by CCD cameras and then processed by software, limiting the wavefront bandwidth to a few hertz. The presented CMOS-based sensors achieves a frame rate of up to 4 kHz by analog image processing on the focal plane. The implemented position sensitive detectors consist of a resistive-ring network of Winner-Take-All circuits with reduced sensitivity to transistor mismatch and fixed-pattern noise. This CMOS-based wavefront sensor allowed the first high-bandwidth wavefront measurements at the human eye.
Keywords
CCD image sensors; CMOS integrated circuits; high-speed integrated circuits; integrated optoelectronics; mixed analogue-digital integrated circuits; photodetectors; wavefront sensors; 0.35 micron; CCD cameras; CMOS integrated circuits; Hartmann-Shack sensor; adaptive optics; analog image processing; application-specific integrated circuits; circuit noise; fixed-pattern noise; focal points displacement; high-bandwidth wavefront measurements; high-speed CMOS wavefront sensor; image sensors; integrated optoelectronics; microlens array; mixed analog-digital integrated circuits; nonlinear circuits; optical wavefront; photodetectors; position sensitive detectors; resistive-ring networks; winner-take-all circuits; Adaptive optics; CMOS image sensors; CMOS process; CMOS technology; Circuits; Image reconstruction; Image sensors; Optical arrays; Optical sensors; Sensor arrays; Application-specific integrated circuits (ASICs); CMOS integrated circuits; circuit noise; image sensors; integrated optoelectronics; mixed analog-digital integrated circuits; nonlinear circuits; photodetectors;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2005.857350
Filename
1522571
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