DocumentCode
1202834
Title
Semiautomatic Quantification of Sharpness of EEG Phenomena
Author
Walter, D.O. ; Muller, H.F. ; Jell, R.M.
Author_Institution
Departments of Physiology and Anatomy and the Brain Research Institute, University of California, Los Angeles, Calif. 90024.
Issue
1
fYear
1973
Firstpage
53
Lastpage
55
Abstract
A method of semiautomatic quantification of sharpness of EEG phenomena is described. The rectified second derivative of the original EEG tracing is utilized for this purpose and has proven satisfactory in connection with the type of question asked. The method is inexpensive and easy to carry out.
Keywords
Anatomy; Brain modeling; Calibration; Councils; Electroencephalography; Epilepsy; Integrated circuit modeling; Light emitting diodes; Operational amplifiers; Physiology; Automatic Data Processing; Biomedical Engineering; Electroencephalography; Humans; Methods;
fLanguage
English
Journal_Title
Biomedical Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0018-9294
Type
jour
DOI
10.1109/TBME.1973.324252
Filename
4120586
Link To Document