Title :
Semiautomatic Quantification of Sharpness of EEG Phenomena
Author :
Walter, D.O. ; Muller, H.F. ; Jell, R.M.
Author_Institution :
Departments of Physiology and Anatomy and the Brain Research Institute, University of California, Los Angeles, Calif. 90024.
Abstract :
A method of semiautomatic quantification of sharpness of EEG phenomena is described. The rectified second derivative of the original EEG tracing is utilized for this purpose and has proven satisfactory in connection with the type of question asked. The method is inexpensive and easy to carry out.
Keywords :
Anatomy; Brain modeling; Calibration; Councils; Electroencephalography; Epilepsy; Integrated circuit modeling; Light emitting diodes; Operational amplifiers; Physiology; Automatic Data Processing; Biomedical Engineering; Electroencephalography; Humans; Methods;
Journal_Title :
Biomedical Engineering, IEEE Transactions on
DOI :
10.1109/TBME.1973.324252
